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Characterization of electroencephalographic overloads at the end of life in critically ill patients

The hypothesis that electroencephalographic overloads at the end of life (end of life electrical surges ELES) are the cause of Near Death Experiences (NDE) has led several studies for more than a decade to focus on corroborating or not the findings that Lakhmir Chawla detected in 2009. The results are evident.

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